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  • ...=Hidetoshi |date=2008-06-27 |title=Quantum State Engineering and Precision Metrology Using State-Insensitive Light Traps |journal=Science |language=en |volume=3 ==AC Stark shift by optical lattice== ...
    3 KB (428 words) - 22:11, 15 July 2022
  • ...it/an/dlpa026/dlpa026.pdf|title=Using DLP® Development Kits for 3D Optical Metrology Systems|last=Barreto|first=Raul|date=2011-05-13|series=DLPA026|publisher=Te ...or patterned laser-induced forward transfer of solid polymer films|journal=Optical Materials Express|language=EN|volume=5|issue=5|pages=1129|doi=10.1364/ome.5 ...
    12 KB (1,672 words) - 22:36, 7 February 2024
  • ...itor-first=Herbert |editor-last=Gross}}</ref> This means that for an ideal optical system, the luminance at the output is the same as the input luminance. For real, passive optical systems, the output luminance is {{em|at most}} equal to the input. As an e ...
    11 KB (1,595 words) - 22:04, 30 November 2023
  • ...eractions|url=https://www.sps.ch/en/artikel/progresses/focal-molography-an-optical-method-for-label-free-detection-of-biomolecular-interactions-77|archive-dat ...ar Sensors by Submicron Referencing and Why They Should Be Interrogated by Optical Diffraction—Part II. Experimental Demonstration|journal=Sensors|language=en ...
    14 KB (1,847 words) - 23:08, 13 December 2023
  • Optical trackers, such as [[Laser rangefinder|laser ranging trackers]] suffer from A spatial scan system uses (optical) beacons and sensors. Two categories can be distinguished: ...
    17 KB (2,418 words) - 15:35, 5 October 2023
  • ...es, symbols, definitions and units for quantities used for [[light]] and [[optical radiation]] in the [[wavelength]] range of approximately 1&nbsp;nm to 1&nbs * [[International vocabulary of metrology|International Vocabulary of Metrology]] ...
    22 KB (2,981 words) - 21:12, 27 December 2023
  • ...ions ([[canal ray]]s) according to their mass-to-charge ratio with an ion optical device with superimposed electric and magnetic fields ([[Wien filter]]). In * {{cite book |title=International vocabulary of basic and general terms in metrology =: Vocabulaire international des termes fondamentaux et généraux de métrolo ...
    16 KB (2,484 words) - 04:26, 3 November 2023
  • ...m cryptography|cryptography]], [[quantum simulator|simulation]], [[quantum metrology|measurement]], [[quantum imaging|imaging]], quantum [[QCD vacuum|energy]] g .../> Current quantum simulators under development include ultracold atoms in optical lattices, trapped ions, arrays of superconducting qubits, and others.<ref n ...
    35 KB (4,497 words) - 00:12, 28 January 2024
  • ...07-365 |issn=0272-9172}}</ref> that support circuit design and statistical metrology. ...electro-magnetic simulations—both for optical patterns and electronic and optical interconnect performance modeling—as well as circuit-level modeling. This ...
    14 KB (2,069 words) - 08:37, 21 February 2024
  • ...sing observation to compare the phenomenon being observed to a [[Standard (metrology)|standard unit]]. The standard unit can be an artifact, process, or definit Human senses are limited and subject to errors in perception, such as [[optical illusion]]s. [[Scientific instrument]]s were developed to aid human abiliti ...
    14 KB (1,987 words) - 09:37, 18 February 2024
  • ...l | doi=10.1063/1.1388868 | title=Picosecond superconducting single-photon optical detector | year=2001 | last1=Gol'Tsman | first1=G. N. | last2=Okunev | firs ...ld |first=Robert H. |date=December 2009 |title=Single-photon detectors for optical quantum information applications |journal=Nature Photonics |language=En |vo ...
    48 KB (6,469 words) - 14:47, 26 February 2024
  • |publisher=Optical Society of America ...|archive-url=https://web.archive.org/web/20120919150451/http://www.electro-optical.com/eoi_page.asp?h=Emissivity%20of%20Materials |archive-date=2012-09-19 |ur ...
    40 KB (5,521 words) - 00:38, 16 February 2024
  • ...oduce any finish from an arbitrary degree of very rough work to a specular optical grade finish the improvement of which is moot. Machine tools produce the su ...ible [[accuracy and precision]] in machine tools (second only to that of [[metrology|metrological]] machines). The Moore firm epitomized the art and science of ...
    36 KB (5,489 words) - 23:03, 21 February 2024
  • ...G_0 = 2 e^2 / h</math>: <math>\alpha = \tfrac{1}{4} Z_0 G_0.</math> The [[optical conductivity]] of [[graphene]] for visible frequencies is theoretically giv ...=Frequency ratio of Al{{sup|+}} and Hg{{sup|+}} single-ion optical clocks; metrology at the 17th&nbsp;decimal place ...
    63 KB (8,617 words) - 16:44, 4 March 2024
  • ...der Colorado observed [[time dilatation]] in the difference in the rate of optical lattice clock ticks at the top of a cloud of strontium atoms, than at the b ...es of Consultative Committees, whose members are the respective national [[metrology]] laboratories. ...
    44 KB (6,747 words) - 20:40, 12 January 2024
  • ...the neutrino signal from an astronomical event might reach Earth before an optical signal can, like [[supernova]]e.<ref>{{Cite journal|last1=Antonioli|first1= ...in a magnetic field (see [[Hughes–Drever experiment]]), and of rotating [[optical resonator]]s (see [[Michelson–Morley experiment#Recent experiments|Resonato ...
    143 KB (20,669 words) - 21:33, 25 February 2024
  • Film speed is found from a plot of [[optical density]] vs. log of exposure for the film, known as the ''D''–log ''H'' cu ...effort on the part of all the film manufacturers, meter manufacturers, the Optical Society of America, and the Bureau of Standards. It was used by all of the ...
    123 KB (17,458 words) - 13:04, 8 March 2024
  • ...nd the active remote observation of Earth through the use of microwave and optical radars.<ref name=":1" /> ...e National Institute of Weights and Standards, today National Institute of Metrology, Standardization and Industrial Quality (Inmetro). ...
    56 KB (8,122 words) - 15:34, 8 January 2024
  • The use of field emission sources in electron optical instruments has involved the development of appropriate theories of charged ...57967|title=Helium ion microscope: A new tool for nanoscale microscopy and metrology|year=2006|last1=Ward|first1=B. W.|last2=Notte|first2=John A.|last3=Economou ...
    125 KB (18,800 words) - 09:14, 8 February 2024
  • The equations provide a mathematical model for electric, optical, and radio technologies, such as power generation, electric motors, [[wirel In [[metrology]] it is used, together with other constants, to define the [[kilogram]], an ...
    252 KB (37,438 words) - 11:29, 20 February 2024