File:AFMsetup.jpg

From KYNNpedia

AFMsetup.jpg ‎(721 × 569 pixels, file size: 86 KB, MIME type: image/jpeg)

This file is from Wikimedia Commons and may be used by other projects. The description on its file description page there is shown below.

Summary

Description
English: Typical atomic force microscope (AFM) setup: The deflection of a microfabricated cantilever with a sharp tip is measured by reflecting a laser beam off the backside of the cantilever while it is scanning over the surface of the sample.
Deutsch: Typischer Aufbau eines Rasterkraftmikroskops (RKM): Die Auslenkung eines Abtastarms (Englisch: Cantilever) mit einer feinen Tastspitze wird während des Abtastens der Oberfläche anhand der Auslenkung eines Laserstrahls bestimmt, der von der Oberseite des Abtastarms reflektiert wird.
Date 2013-10-13--202.160.164.205 09:49, 3 October 2013 (UTC)--202.160.164.205 09:49, 3 October 2013 (UTC)
Source

http://kristian.molhave.dk

Author yashvant
Permission
(Reusing this file)		 CC-BY-2.5, please acknowledge the Opensource Handbook of Nanoscience and Nanotechnology if you use this illustration!
File:AFM schematic (EN).svg is a vector version of this file. It should be used in place of this JPG file when not inferior.
File:AFMsetup.jpg → File:AFM schematic (EN).svg
For more information, see Help:SVG.
In other languages
Alemannisch ∙ العربية ∙ беларуская (тарашкевіца) ∙ български ∙ বাংলা ∙ català ∙ нохчийн ∙ čeština ∙ dansk ∙ Deutsch ∙ Ελληνικά ∙ English ∙ British English ∙ Esperanto ∙ español ∙ eesti ∙ euskara ∙ فارسی ∙ suomi ∙ français ∙ Frysk ∙ galego ∙ Alemannisch ∙ עברית ∙ hrvatski ∙ magyar ∙ հայերեն ∙ Bahasa Indonesia ∙ Ido ∙ italiano ∙ 日本語 ∙ ქართული ∙ 한국어 ∙ lietuvių ∙ македонски ∙ മലയാളം ∙ Bahasa Melayu ∙ norsk bokmål ∙ Plattdüütsch ∙ Nederlands ∙ norsk nynorsk ∙ norsk ∙ occitan ∙ polski ∙ prūsiskan ∙ português ∙ português do Brasil ∙ română ∙ русский ∙ sicilianu ∙ Scots ∙ slovenčina ∙ slovenščina ∙ српски / srpski ∙ svenska ∙ தமிழ் ∙ ไทย ∙ Türkçe ∙ татарча / tatarça ∙ українська ∙ vèneto ∙ Tiếng Việt ∙ 中文 ∙ 中文（中国大陆） ∙ 中文（简体） ∙ 中文（繁體） ∙ 中文（马来西亚） ∙ 中文（新加坡） ∙ 中文（臺灣） ∙ 中文（臺灣） ∙ +/−
New SVG image

Licensing

w:en:Creative Commons
attribution
This file is licensed under the Creative Commons Attribution 2.5 Generic license.
You are free:
  • to share – to copy, distribute and transmit the work
  • to remix – to adapt the work
Under the following conditions:
  • attribution – You must give appropriate credit, provide a link to the license, and indicate if changes were made. You may do so in any reasonable manner, but not in any way that suggests the licensor endorses you or your use.

Captions

Add a one-line explanation of what this file represents

Items portrayed in this file

depicts

media type

image/jpeg

checksum

e554ced62e546be1eaba9097f6f6078f0da81eca

determination method or standard: SHA-1

data size

88,071 byte

height

569 pixel

width

721 pixel

File history

Click on a date/time to view the file as it appeared at that time.

Date/TimeThumbnailDimensionsUserComment
current14:10, 21 November 2006Thumbnail for version as of 14:10, 21 November 2006721 × 569 (86 KB)wikimediacommons>KristianMolhave*Figure Caption: Typical AFM setup. The deflection of a microfabricated cantilever with a sharp tip is measured be reflecting a laser beam off the backside of the cantilever while it is scanning over the surface of the sample. *This illustration was made

The following 2 pages use this file:

Retrieved from "https://kynnco.com:443/kynnpedia/index.php?title=File:AFMsetup.jpg"