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{{short description|Noncontact variant of atomic force microscopy}} [[File:Kelvin probe force microscopy.svg|thumb|400px|In Kelvin probe force microscopy, a conducting cantilever is scanned over a surface at a constant height in ...

{{Short description|Microscopy technique for piezoelectric materials}} [[File:Bulk BTO PFM scan.png|thumb|alt=Piezoresponse Force Microscopy image of BaTiO3 domains|PFM of [[barium titanate|BaTiO₃]] single ...

*[[Hall probe]] *[[Capacitance probe]] ...

...ournal | doi = 10.1103/Physics.4.43| title = Finally, results from Gravity Probe B| journal = Physics| volume = 4| issue = 43| pages = 43| year = 2011| last ...rst4 = Ł. | title = Calibrated work function mapping by Kelvin probe force microscopy | doi = 10.1063/1.5007619 | journal = Review of Scientific Instruments | vo ...

...sity-wave origin of cuprate checkerboard visualized by scanning tunnelling microscopy| journal = PNAS| volume =4| issue =9| pages = 696–699| display-authors= et ...der in manganites visualized with cryogenic scanning transmission electron microscopy| journal = PNAS| volume =115| issue =7| pages = 1–6| display-authors= et al ...

* [[Nanoworld]], Russian Society of Scanning Probe Microscopy and Nanotechnology ...

...nal|first1=G.|last1=Binnig|first2=H.|last2=Rohrer|title=Scanning tunneling microscopy|journal=IBM Journal of Research and Development|volume=30|issue=4|year=1986 ...]]([[Miller index|100]]) surface, as visualized using [[scanning tunneling microscopy]]. The positions of the individual atoms composing the surface are visible. ...

...eposition methods) by deterministic methods comprising nudging them with [[scanning tunneling microscope|STM]] or [[Atomic force microscope|AFM]] probes and ca ...uthor=R. V. Lapshin|year=2011|contribution=Feature-oriented scanning probe microscopy|title=Encyclopedia of Nanoscience and Nanotechnology|editor=H. S. Nalwa|vol ...

...ntilever in Resonance.png|thumb|MEMS microcantilever resonating inside a [[scanning electron microscope]]]] ...lithography]] (often abbreviated as e-beam lithography) is the practice of scanning a beam of [[electron]]s in a patterned fashion across a surface covered wit ...

==Atomic force microscopy== A key application of NEMS is [[atomic force microscopy|atomic force microscope]] tips. The increased sensitivity achieved by NEMS ...

...ount of molecules, somewhat similar to [[Brewster's angle|Brewster angle]] microscopy (this latter is most commonly used together with a [[Langmuir–Blodgett trou ...lti-parametric surface plasmon resonance]], two SPR curves are acquired by scanning a range of angles at two different wavelengths, which results in a unique s ...

...ve energies of the order of 10 [[electron volt|keV]] and hence are able to probe atomic length scales, and are used to measure variations in electron charge [[Neutron]]s can also probe atomic length scales and are used to study the scattering off nuclei and el ...

===Field electron microscopy and related basics=== ...124-5}}</ref><ref>{{cite journal|title = Recent advances in field electron microscopy of metals|year = 1975|journal =Advances in Electronics and Electron Physics ...

* [[Timeline of microscope technology|History of microscopy]] * {{annotated link|Horizon scanning}} ...

...al assemblies. It forms the basis for [[scanning probe microscopy|scanning probe microscopes]] that resolve images at the scale of [[atom]]s. It is used in .... A piezo structure dimension change can be seen by using a surface finish probe instrument that detects um surface finish changes. Apply an electric filed ...