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- ...neering]] and [[materials science]], '''electromaterials''' are the set of materials which store, controllably convert, exchange and conduct electrically [[char ...ng Polymers, 2 Volume Set. (2007). [https://doi.org/10.1201/b12346].</ref> Materials which can be ionised (i.e. electrons either added or stripped away) may als ...3 KB (431 words) - 18:57, 10 January 2024
- ...ringer, New York 2005, {{ISBN|3-540-25470-6}}</ref> When this happens, the semiconductor is said to be in a state of '''velocity saturation'''. <ref name="e2">{{cit ...10-100 kV/cm. Both saturation field and the saturation velocity of a semiconductor material are typically strong function of impurities, [[crystal defect]]s a ...6 KB (846 words) - 10:19, 13 April 2023
- ...ive force appears, whose magnitude depends on the voltage and the specific materials involved. The attractive force is much larger than would be produced by Cou ...| title = Materials with electroprogrammable stiffness | journal= Advanced Materials | volume = 33 | issue = 35 | page = 2007952 | year = 2021 | url = https://w ...2 KB (249 words) - 23:17, 6 March 2024
- ...ative positions of the atoms or molecules are completely random. Amorphous materials, such as [[liquids]] and [[glass]]es, represent an intermediate case, havin ...ighly perfect crystals are silicon [[Boule (crystal)|boules]] produced for semiconductor electronics; these are large [[single crystal]]s (so they have no grain bou ...2 KB (329 words) - 18:02, 27 December 2023
- ...Solar Transistor and Photoferroelectric Memory|journal=Advanced Functional Materials|volume=28|issue=17|pages=1707099|language=en|doi=10.1002/adfm.201707099|iss ...(a material that absorbs [[photon energy]]) in series with a functional [[semiconductor]] transport layer, which internal conductivity or contact resistance can be ...4 KB (500 words) - 22:54, 3 May 2021
- ...ying optoelectronic properties of semiconductors and other light absorbing materials.<ref name="RSC-def"> </ref> The setup of the technique involves having a semiconductor contacted with electrodes allowing for application of an electric bias, whi ...5 KB (659 words) - 01:21, 12 September 2022
- ...ed for various applications, including electric and magnetic properties of materials as well as reactivity. The temperature coefficient of most of the reactions ...increasing temperature, typically in a defined temperature range. For most materials, electrical resistivity will decrease with increasing temperature. ...12 KB (1,785 words) - 06:12, 8 December 2023
- ...an [[accelerometer]] that employs the [[piezoelectric effect]] of certain materials to measure dynamic changes in mechanical variables (e.g., acceleration, vib ...ial. This differs from a [[piezoresistive]] effect in that piezoresistive materials experience a change in the resistance of the material rather than a change ...11 KB (1,543 words) - 08:30, 1 July 2023
- Molybdenum disilicide and MoSi<sub>2</sub>-based materials are usually made by [[sintering]]. [[Plasma spraying]] can be used for prod ...]], [[steel]], [[electronics]], [[ceramic]]s, and in [[heat treatment]] of materials. While the elements are brittle, they can operate at high power without agi ...5 KB (685 words) - 07:44, 30 October 2023
- '''Glossary of [[microelectronics]] [[Semiconductor device fabrication|manufacturing]] terms''' ...rcuit|3D integration]]''' – an advanced [[Semiconductor device fabrication|semiconductor]] technology that incorporates multiple layers of [[Electronic circuit|circ ...14 KB (1,872 words) - 11:55, 18 October 2023
- {{short description|Subdiscipline of condensed matter physics that deals with materials of an intermediate size}} ...ts contain many atoms. Whereas average properties derived from constituent materials describe macroscopic objects, as they usually obey the laws of [[classical ...11 KB (1,480 words) - 14:05, 1 January 2024
- ** [[Materials engineering]] ...engineering]] (includes microelectronics engineering, microelectronics and semiconductor engineering) ...10 KB (998 words) - 19:22, 5 November 2023
- ...rovided the basis for a variety of novel and specialized applications in [[semiconductor]] manufacturing, [[microelectromechanical systems]], [[nanoelectromechanica ...metal around the cold copper crucible walls. This ensures that the purest materials can be produced and refined in electron-beam vacuum furnaces. Rare and [[re ...9 KB (1,242 words) - 16:23, 2 August 2023
- ...erstood by nature of chemical bonding of atoms at the surface. In metallic materials, atomic chemical bonding structure at the surface is very different from in ====Semiconductor surfaces==== ...15 KB (2,291 words) - 01:48, 13 October 2022
- ...er|isbn=9780750669061|location=Oxford, UK|pages=607}}</ref> These produced materials and structures that have 1-100 nm in dimensions.<ref name=":0" /> ** [[Channel (semiconductor)|channels]] ...7 KB (912 words) - 20:26, 15 February 2024
- ...or aging|one of the mechanisms]] that adversely affects the [[Reliability (semiconductor)|reliability of semiconductors]] of solid-state devices.<ref name=KK2011>{{ ...term “hot carrier injection” usually refers to the effect in [[Metal–Oxide–Semiconductor Field-Effect Transistor|MOSFET]]s, where a carrier is injected from the con ...13 KB (1,959 words) - 16:45, 11 August 2023
- ...istic|current–voltage (I–V) relationship]] of [[Diode#Semiconductor diodes|semiconductor diodes]] in moderate [[constant current]] [[forward bias]] or [[reverse bia ...nding on the [[fabrication process]] and [[List of semiconductor materials|semiconductor material]]. The ideality factor was added to account for imperfect [[P–n ju ...12 KB (1,851 words) - 22:29, 3 January 2024
- ...en used to fit the complex [[refractive index]] of amorphous semiconductor materials at frequencies greater than their optical [[band gap]]. The [[dispersion re | title = Parameterization of the optical functions of amorphous materials in the interband region ...8 KB (1,066 words) - 17:00, 5 January 2024
- In electronic and semiconductor devices, transient or frequency-dependent current between terminals contain ...|first=S.E. |date=Oct 1985 |title=Techniques for small-signal analysis of semiconductor devices |journal=IEEE Transactions on Computer-Aided Design of Integrated C ...9 KB (1,213 words) - 09:28, 11 September 2023
- ...refractive index of amorphous and crystalline semiconductor and dielectric materials at energies near and greater than their optical [[band gap]].<ref name = "C ...uhi and Bloomer derived a formula for <math>\kappa(E)</math> for amorphous materials. The formula and complementary Kramers–Kronig integral are given by<ref nam ...11 KB (1,270 words) - 23:07, 9 December 2023