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Electron microscopy
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Electron microscopy
Basics
Electron microscopy
History
Micrograph
Microscope
Timeline of microscope technology
Electron
interaction
with matter
Auger effect
Bremsstrahlung
Electron diffraction
Electron scattering
Kikuchi lines
Secondary electrons
X-ray fluorescence
Instrumentation
Detectors for transmission electron microscopy
Electron gun
Everhart–Thornley detector
Field electron emission
Field emission gun
Magnetic lens
Stigmator
Microscopes
EM
Correlative light EM
Cryo-EM
EMP
MicroED
Liquid-Phase EM
Low-energy EM
Photoemission EM
SEM
Environmental SEM
CryoSEM
Confocal SEM
SEM-XRF
Ultrafast SEM
TEM
Cryo-TEM
Cryo-ET
EFTEM
HRTEM
STEM
4D STEM
Aberration-Corrected TEM
Techniques
Annular dark-field imaging
Cathodoluminescence
Charge contrast imaging
CBED
Dark-field microscopy
EDS
EBSD
TKD
ECCI
EELS
EBIC
Electron holography
Electron tomography
FIB
FEM
Immune electron microscopy
Geometric phase analysis
PINEM
Precession electron diffraction
Serial block-face scanning electron microscopy
WDXS
WBDF
Others
Developers
Albert Crewe
Bodo von Borries
Dennis Gabor
Ernst G. Bauer
Ernst Ruska
Gerasimos Danilatos
Harald Rose
James Hillier
Manfred von Ardenne
Max Knoll
Maximilian Haider
Nestor J. Zaluzec
Ondrej Krivanek
Thomas Eugene Everhart
Vernon Ellis Cosslett
Vladimir K. Zworykin
Manufacturers
Carl Zeiss AG
Hitachi High-Technologies
JEOL
Leica
TESCAN
Thermo Fisher Scientific
Software
CASINO
CrysTBox
EM Data Bank
EMsoft
Digital Micrograph
Direct methods
IUCr
MTEX
Multislice
Category
Commons
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