Template:Scanning probe microscopy: Difference between revisions

Latest revision as of 11:20, 27 February 2021

v t e Scanning probe microscopy
Common	Atomic force Conductive Infrared Non-contact Photoconductive Scanning tunneling Electrochemical Spin polarized	Typical atomic force microscopy set-up
Other	Ballistic electron emission Chemical force Electrostatic force Kelvin probe force Magnetic force Magnetic resonance force Near-field scanning optical Nano-FTIR Photon scanning Photothermal microspectroscopy Piezoresponse force Scanning capacitance Scanning electrochemical Scanning gate Scanning Hall probe Scanning ion-conductance Scanning joule expansion Scanning Kelvin probe Scanning quantum dot microscopy Scanning SQUID microscope Scanning SQUID microscopy Scanning thermal Scanning voltage
Applications	Scanning probe lithography Dip-pen nanolithography Feature-oriented scanning Millipede memory
See also	Nanotechnology Microscope Microscopy Vibrational analysis